System for measuring the luminance characteristics of objects, in particular objects with luminance dependent on emitting direction
AssigneeEldim, Inc.
InventorThierry Leroux
Life of this patent
Estimating the term…
Abstract
A system for measuring the luminance characteristics of objects, particularly objects with luminance dependent on the emission direction. This system includes an image sensor (8) and optical means (16, 18, 26, 28) provided to form the image of the totality of an object (6) on the sensor and to select, for each point of the object, with a view to forming the corresponding image-point, those of the light rays coming from this point of the object which propagate in a way approximately parallel to the optical axis (X) of the optical means.
Claims13
A system for measuring point by point the luminance characteristics of an extended object, this system including:
- an image sensor (8) and
- optical means (14) having an optical axis (X) and provided to form a image of the totality of the object (6) on the sensor, each point of the image allowing a measurement to be taken on a point of the object, this system being characterized in that the optical means (14) are additionally provided to select, for each point of the object, with a view to forming the corresponding image-point, those of the light rays coming from this point of the object which propagate in a way approximately parallel to the optical axis of the optical means, the observation of the object being effected at a constant angle.
Dependencies are inferred from the claim text.