Circuit and method for calibrating the phase shift between a plurality of digitizers in a data acquisition system

A subsystem for calibrating a phase shift between a first digitizer and a second digitizer in a measurement acquisition system comprising a plurality of digitizers said subsystem comprising:

• means for sampling and digitizing a high-frequency analog input signal, the sampling times of the different digitizers being phase-shifted,
• means for calibrating said phase shift including:
• means for calculating interpolated digital values determined by interpolating at the sampling times of the first digitizer from the digital values supplied by the second digitizer;
• means for determining a phase shift correction value chosen so that the distance between a sequence of digital values determined by the first digitizer and the sequence of said interpolated digital values is minimized;
• and
• means for utilizing the phase shift correction value or values to modify said phase shift between the first digitizer and the second digitizer,
• wherein said phase shift correction value is determined according to the following equation:
• u = p · ∑ i ⁢ ⁢ ( r i - s i ) · ( s i - s i - 1 ) ∑ i ⁢ ⁢ ( s i - s i - 1 ) · ( s i - s i - 1 )
• and wherein u represents the phase shift correction value, p represents the sampling period, ri represents the value supplied by the first digitizer at the time i, and si represents the value supplied by the second digitizer at the corresponding sampling time.

An analog-to-digital conversion circuit for a high-frequency data acquisition system, comprising:

• a plurality of digitizers capable of sampling and digitizing a high-frequency analog input signal, the sampling times of the different digitizers being phase-shifted,
• a sampling signal generator controlling the sampling signals through programmable delays, said sampling signals defining the sampling times of said digitizers,
• a phase shift calibration circuit between a first digitizer and a second digitizer,
• wherein said phase shift calibration circuit calculates interpolated digital values determined by interpolating at the sampling times of the first digitizer from the digital values supplied by the second digitizer and determines a phase shift correction value chosen so that the distance between a sequence of digital values determined by the first digitizer and the sequence of said interpolated digital values is minimized;
• and
• wherein said phase shift correction value is applied to said programmable delay or delays.

A method for calibrating a phase shift between a first digitizer and a second digitizer in a measurement acquisition system comprising a plurality of digitizers said method comprising the steps of:

• sampling and digitizing a high-frequency analog input signal, the sampling times of the different digitizers being phase-shifted,
• calibrating said phase shift by performing the steps of:
• calculating interpolated digital values determined by interpolating at the sampling times of the first digitizer from the digital values supplied by the second digitizer;
• determining a phase shift correction value chosen so that the distance between a sequence of digital values determined by the first digitizer and the sequence of said interpolated digital values is minimized;
• and
• utilizing the phase shift correction value or values to modify said phase shift between the first digitizer and the second digitizer.

An analog-to-digital conversion circuit for a high-frequency data acquisition system, comprising:

• a plurality of digitizers capable of sampling and digitizing a high-frequency analog input signal, the sampling times of the different digitizers being phase-shifted,
• a circuit for calibrating the phase shift between a first digitizer and a second digitizer,
• said circuit for calibrating said phase shift determining a phase shift correction value chosen so that the distance between a sequence of digital values determined by the first digitizer, and a sequence of corresponding digital values determined by interpolating at the sampling times of the first digitizer from the digital values supplied by the second digitizer, is minimized, wherein said phase shift correction value is determined according to the following equation:
• u = p · ∑ i ⁢ ⁢ ( r i - s i ) · ( s i - s i - 1 ) ∑ i ⁢ ⁢ ( s i - s i - 1 ) · ( s i - s i - 1 )
• wherein u represents the phase shift correction value, p represents the sampling period, ri represents the value supplied by the first digitizer at the time i and si the value supplied by the second digitizer at the corresponding sampling time.

An analog-to-digital conversion circuit for a high frequency data acquisition system, comprising:

• a plurality of digitizers capable of sampling and digitizing a high-frequency analog input signal, the sampling times of the different digitizers being phase-shifted;
• a sampling signal generator controlling the sampling signals through programmable delays, said sampling signals defining the sampling times of said digitizers;
• a phase shift calibration circuit between a first digitizer and a second digitizer, said circuit for calibrating said phase shift determining a phase shift correction value chosen so that the distance between a sequence of digital values determined by the first digitizer, and a sequence of corresponding digital values determined by interpolating at the sampling times of the first digitizer from the digital values supplied by the second digitizer, is minimized, said correction value being applied to said programmable delay or delays;
• and
• a digital processor designed to process the digital values supplied, by said plurality of digitizers during said calibration process to determine the phase shift correction value or values and to control said programmable delays, wherein said phase shift correction value is determined according to the following equation:
• u = p · ∑ i ⁢ ⁢ ( r i - s i ) · ( s i - s i - 1 ) ∑ i ⁢ ⁢ ( s i - s i - 1 ) · ( s i - s i - 1 )
• and wherein u represents the phase shift correction value, p represents the sampling period, ri represents the value supplied by the first digitizer at the time i, and si represents the value supplied by the second digitizer at the corresponding sampling time.

A method for calibrating a phase shift between a first digitizer and a second digitizer in a measurement acquisition system comprising a plurality of digitizers, said method comprising the steps of:

• sampling and digitizing a high-frequency analog input signal, the sampling times of the different digitizers being phase-shifted;
• and
• determining the phase shift so that the distance between a sequence of digital values determined by the first digitizer, and a sequence of corresponding digital values determined by interpolating at the sampling times of the first digitizer from the digital values supplied by the second digitizer, is minimized,
• wherein said phase shift is determined using a phase shift correction value calculated according to the following equation:
• u = p · ∑ i ⁢ ⁢ ( r i - s i ) · ( s i - s i - 1 ) ∑ i ⁢ ⁢ ( s i - s i - 1 ) · ( s i - s i - 1 )
• and wherein u represents the phase shift correction value, p represents the sampling period, ri represents the value supplied by the first digitizer at the time i, and si represents the value supplied by the second digitizer at the corresponding sampling time.