Semiconductor integrated circuit device
AssigneeRohm Co., Ltd.
InventorKei Nishioka
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Abstract
A semiconductor integrated circuit device (IC) 10 incorporates an array Dch of measurement elements D1-Dm in the form of buffers for example connected in series. These elements represent standard internal elements of the IC 10. The array Dch is supplied with a signal in synchronism with a fast clock signal CLK of the IC 10. The propagation speed of the signal is given in terms of the number of the measurement elements through which the propagation signal has passed in one clock interval. This can be done by simply supplying the IC 10 with a test signal GO and a reset signal RES as the instruction signals from an external tester. A tester slower in the operating frequency than the IC 10 can be used to measure the propagation speed of the IC 10.
Claims7
A semiconductor integrated circuit device having a multiplicity of elements, comprising:
- a predetermined number of measuring elements connected in series forming an array of measurement elements;
- and
- detection means for simultaneously detecting the electric potentials at predetermined nodes in said array, and for outputting the detected potentials in the form of numerical data, wherein
- the array of measuring elements is provided at the input terminal thereof with a propagation signal;
- and
- the detection means are provided with a delayed detection signal a predetermined time after the application of the propagation signal to the array.
Dependencies are inferred from the claim text.