Method and device for detection of a defect in a sensor system
AssigneeEADS Deutschland GmbH
InventorsAndreas Langmeier, Winfried Lohmiller
Life of this patent
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Abstract
A method for implementation in a measuring system containing a sensor system and an arithmetic unit for detection of a defect in the measuring system, wherein at least one state variable of the system is derived from at least one sensor value in the measuring system, wherein a cost function value based on deviation of the measured value y from the calibration as a function of a previously calculated state x is calculated for the respective measurement and the calculated squared deviation is then compared with a corresponding threshold value. An error is identified and if necessary appropriate action is taken if the threshold value is exceeded.
Claims12
In a method for implementation in a measuring system containing a sensor system and an arithmetic unit for detection of a defect in the measuring system, wherein at least one state variable of the system is derived from at least one sensor value in the measuring system, the improvement comprising:
- calculating a cost function value based on deviation of the measured value y from a calibration as a function of a previously calculated state x for the respective measurement, and
- comparing the calculated cost function value with a corresponding threshold value to identify an error if said threshold value is exceeded.
Dependencies are inferred from the claim text.