Fraction defective estimating method, system for carrying out the same and recording medium
AssigneeHitachi, Ltd.
InventorsTatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi, Ltd.
InventorsTatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
Estimating the term…
A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
An article fraction defective estimating method of estimating an assembly fraction defective of an article, said method comprising the steps of:
An article fraction defective estimating method of estimating an assembly fraction defective of an article, said method comprising the steps of:
An article fraction defective estimating method of estimating an assembly fraction defective of an article, said method comprising the steps of:
A method of estimating a fraction defective of an article which is manufactured by assembling a plurality of constituent parts, said method comprising the steps of:
A method of estimating a fraction defective of an article which is manufactured by assembling a plurality of constituent parts, said method comprising the steps of:
Dependencies are inferred from the claim text.