Modular interface between a device under test and a test head
AssigneeAdvantest Corporation
InventorJames Warren Frame
Life of this patent
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Abstract
In order to form a modular interface between a DUT board, which is housing devices under tests (DUT), to cables connected to a test head, a board spacer is provided that has an array of connectors. Each cable is connected to a respective connector, and the DUT board contains a corresponding array of connection points which are less than or equal to the number of connectors in the arrays on the board spacer. In this way, a common board spacer can be used to connect the cables to DUT boards housing different types of DUTs since the location of the connection points on the board spacer is known and kept constant. This interface allows a high speed and high fidelity connection between the test head and the devices on the DUTs for frequencies in excess of 50 MHz.
Claims26
An interface between a device under test (DUT) and cables, comprising:
- a first board having an array of first connectors, each first connector connected to a respective cable;
- and
- a second board holding the DUT and having second connectors, each second connector being connected to the DUT and to a respective first connector, and where the number of second connectors is less than the number of first connectors.
A method of connecting a device under test (DUT) on a DUT board to cables for testing, comprising:
- unplugging a first DUT board having a first number of connectors from respective cables held in an array on a board spacer, the first connectors being connected to a first DUT held by the first DUT board;
- and
- plugging a second DUT board having a second number of connectors different from the first number of connectors into the cables held in the array on the board space, the second connectors being connected to a second DUT held by the second DUT board.
A method of connecting a device under test (DUT) on a DUT board to cables for testing, comprising:
- unplugging a first DUT board having a first number of connectors from respective cables held in an array on a board spacer;
- and
- plugging a second DUT board having a second number of connectors different from the first number of connectors into the cables,
- wherein the first connector comprises a shielded controlled impedance connector, and the second connector comprises a header.
A method of connecting a device under test (DUT) on a DUT board to cables for testing, comprising:
- unplugging a first DUT board having a first number of connectors from respective cables held in an array on a board spacer;
- and
- plugging a second DUT board having a second number of connectors different from the first number of connectors into the cables,
- wherein the first connector comprises a header, and the second connector comprises a shielded controlled impedance connector.
A method of connecting a device under test (DUT) on a DUT board to cables for testing, comprising:
- unplugging a first DUT board having a first number of connectors from respective cables held in an array on a board spacer;
- and
- plugging a second DUT board having a second number of connectors different from the first number of connectors into the cables,
- wherein:
- the first and second connectors have signal and ground lines and have a pitch between adjacent signal and ground lines of 0.1″ or less, and
- the first and second connectors comprise pairs of 2 mm connectors and headers.
Dependencies are inferred from the claim text.