Micro goniometer for scanning probe microscopy

A method for testing the dynamic interactive forces between two molecular structures with a scanning probe microscope at differing degrees of tip interaction, the scanning probe microscope having a goniometer including a cantilever having a cantilevered end and a supported end, a tip supported at the cantilevered end, and a block disposed at the supported end, said block having at least one pair of piezoelectric layers for controlling the tip about a substrate surface, the tip having a first molecular structure and the substrate surface having a second molecular structure, the method comprising the steps of:

• oscillating the tip along a path normal to the substrate surface by controlling said at least one pair of piezoelectric layers and at a first angle relative to the substrate surface, said piezoelectric layers being individually deformable at different rates resulting in deformation of said block and tilting of the cantilever and tip connected therewith, such that forces of interaction exists between the tip and substrate material, measuring the interactive forces between the tip and the substrate surface for the first angle along the normal path, varying the tip angle to a second angle by controlling said at least one pair of piezoelectric layers, and measuring the interactive forces at the second angle along the normal path.

A method for testing the dynamic interactive forces between two molecular structures with a scanning probe microscope at differing degrees of tip interaction, the scanning probe microscope having a goniometer including a cantilever having a cantilevered end and a supported end, a tip supported at the cantilevered end, and a block disposed at the supported end, said block having at least one pair of piezoelectric layers for controlling a tip about a substrate surface, the tip having a first molecular structure and the substrate surface having a second molecular structure, the method comprising the steps of:

• swinging the tip in a pendular motion in a plane perpendicular to the substrate surface by controlling said at least one pair of piezoelectric layers, said piezoelectric layers being individually deformable at different rates resulting in deformation of said block and tilting of the cantilever and tip connected therewith, such that forces of interaction exists between the tip and substrate material, and measuring the interactive forces between the tip and the substrate surface for varying angles along the pendular path.