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US 6,551,835 B1Granted
Method and apparatus for thermally analyzing a material
AssigneeMettler-Toledo AG
InventorsJürgen Schawe, Ingo Alig, Dirk Lellinger
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Abstract
A method and apparatus for thermally analyzing a sample of a material by detecting a heat flow between the sample and a heat source (1, 2) and ,evaluating a functional relation between the measured heat flow and an associated temperature is based on controlling the heating power of the heat source (1, 2) so as to cause the heat source to follow a temperature program (Tp) as a function of time superposed with a stochastic variation (FSIP), (FIG. 2).
Claims13
A method for thermally analyzing a material, comprising the steps of:
- providing a sample of said material;
- providing a heat source so as to cause a flow of heat between said sample and said heat source;
- controlling a heating condition of said heat source as a function of time;
- measuring a signal representative of said heat flow between said sample and said heat source and a signal representative of a temperature associated with said heat flow;
- and
- evaluating a functional relation between said measured heat flow and temperature signals, wherein said controlling step comprises stochastically modifying said heating condition.
3 more elements
Dependencies are inferred from the claim text.