Testing method and apparatus of glitch noise and storage medium
AssigneeCanon Kabushiki Kaisha
InventorKazuya Takahashi
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Abstract
An A/D converter executes an A/D conversion of an inputted signal having a ramp waveform in response to a clock signal and sequentially stores digital output data into memories. In response to the clock signal, the storage data is read out from the memories. In a calculator, from certain data, data whose phase is delayed by one clock from such data is subtracted and a peak value of a subtraction value is detected by a peak detector. When the peak value lies within a range of ±1, it is determined that no glitch noise occurs. When the peak value exceeds the range of ±1, it is decided that the glitch noise has occurred.
Claims15
A method of testing an A/D converter for glitch noise, comprising the steps of:
- inputting an analog signal into an A/D converter;
- storing first and second digital output codes outputted from the A/D converter in first and second memory areas, respectively, each of the first and second digital output codes comprising data elements, the second digital output code shifted from the first digital output code by a predetermined amount;
- obtaining, data element by data element, a difference between one of the data elements of the first digital output code stored in the first memory area and a corresponding one of the data elements of the second digital output code stored in the second memory area;
- and
- determining a quality of the A/D converter for detecting a glitch based on whether a peak value of the difference obtained in said obtaining step is in a predetermined range.
A testing apparatus for testing an A/D converter for glitch noise, comprising:
- signal generation means for generating an analog signal;
- input means for inputting the analog signal generated by said signal generating means to the A/D converter;
- memory means for storing first and second digital output codes from the A/D converter in first and second memory areas, respectively, each of the first and second digital output codes comprising data elements, the second digital output code shifted from the first digital output code by a predetermined amount;
- deriving means for deriving, data element by data element, a difference between one of the data elements of the first digital output code stored in the first memory area and a corresponding one of the data elements of the second digital output code stored in the second memory area;
- detecting means for detecting a glitch based on a peak value of the difference derived by said deriving means;
- and
- timing generation means for generating a timing for generating the analog signal by said signal generation means, a timing operation for the A/D converter, and a timing for shifting the digital output data by the predetermined clocks.
A computer-readable storage medium which stores a program to test an A/D converter having an input signal of ramp waveform, said program causing a computer to execute the steps of:
- storing first and second digital output data from the A/D converter in first and second memory areas, respectively, each of the first and second digital output data comprising data elements, the second digital output data shifted from the first digital output data by a predetermined amount;
- obtaining, data element by data element, a difference between one of the data elements of the first digital output data stored in the first memory area and a corresponding one of the data elements of the second digital output data stored in the second memory area;
- and
- determining a quality of the A/D converter for glitch noise, the A/D converted based on whether a peak value of the difference obtained in said obtaining step in a predetermined range.
Dependencies are inferred from the claim text.