Transmission illumination type differential interference microscope
AssigneeNikon Corporation
InventorsTatsuro Otaki, Kumiko Otaki
Life of this patent
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AssigneeNikon Corporation
InventorsTatsuro Otaki, Kumiko Otaki
Estimating the term…
In the transmission illumination type differential interference microscope, light in a given polarized state is separated by a first birefringent optical member 1 into two linearly polarized light components L1 and L2 and both of the polarized light components are converted into parallel light by means of a condenser lens 13. The object being examined 15 is illuminated by the polarized light components which are then converted into convergent light by an objective 16. Both of the polarized light components are then synthesized into a single light beam by a second birefringent optical element 2 and both of the polarized light components of the synthesized light beam are caused to undergo polarization interference by an analyzer 17 so that an enlarged image 18 of the object being examined 15, is formed. At least one of the first and second birefringent optical members 1 and 2 is formed by joining one isotropic prism 1g or 2g, consisting of an isotropic optical material, and one birefringent prism 1a or 2a, consisting of a birefringent optical material.
A differential interference microscope comprising:
A differential interference microscope comprising:
Dependencies are inferred from the claim text.