Method of interconnecting with a system board

A method of testing a system board having an area of interest, comprising:

• removing a cover to provide access to the area of interest on said system board;
• positioning a probe test assembly comprising an electrically conductive probe plate associated with a pattern plate, said pattern plate comprised of an insulating material, said probe plate having a plurality of probe holes therethrough which are aligned with a plurality of guide holes in said pattern plate, said probe holes are positioned relative to the area of interest;
• providing a ground connection between said probe plate and a ground at the area of interest with a ground pin;
• inserting through a desired said guide hole and associated said probe hole a probe, said probe having a coaxial probe element whereby a center conductor of said coaxial probe element provides an electrical connection with a signal at the area of interest and an outer conductor of said coaxial probe element electrically connects with said probe plate to provide a return ground path;
• connecting said probe to an external device for testing of said signal;
• and
• replacing said cover to prohibit access to the area of interest on said system board after testing is completed.