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AssigneeVisteon Global Technologies, Inc.
InventorArnold David Nielsen
Estimating the term…
A testing device generates electromagnetic noise such as transients, power interruptions and Radio Frequency Interference (RFI) for application to an electronic device to test the immunity of the electronic device to electromagnetic noise or to test the performance of the electronic device during exposure to electromagnetic noise. The testing device promotes an economical and efficient evaluation of Electromagnetic Compatibility (EMC) of an electronic device during product design or otherwise. The testing device includes a switch having electrical contacts for producing electromagnetic noise during a transition between a closed state and an open state of the electrical contacts and a trigger that is coupled to the switch. The trigger is arranged to change states between the closed state and the open state of the electrical contact. An input terminal is associated with the switch for applying electrical energy to the switch. An output terminal is associated with the switch for connection to the electronic device for testing operation of the electronic device in response to the electromagnetic noise.
A testing device for generating electromagnetic noise for application to an electronic device, the testing device comprising:
A method for generating electromagnetic noise for application to an electronic device, the method comprising:
A method of testing an electronic device for immunity to electromagnetic noise, the method comprising:
Dependencies are inferred from the claim text.