Semiconductor device
AssigneesNEC Corporation, NEC Electronics Corporation
InventorTakeshi Oikawa
Life of this patent
Estimating the term…
Abstract
A semiconductor device having a fuse evaluation circuit is provided. Fuse evaluation circuit (100) can include, a reference voltage generation circuit (110), a fuse circuit (120-n), and a fuse evaluation control circuit (130). Fuse circuit (120-n) can include a fuse (Fn) and evaluation transistor (Tn) arranged in-series and providing an evaluation node (Nn) at their connection. Reference voltage generation circuit (110) can provide a reference voltage (VG1) at a control gate of evaluation transistor (Tn). Fuse evaluation control circuit (130) can vary the impedance of the evaluation transistor (Tn) by varying the potential of reference voltage (VG1). Fuse evaluation circuit (100) can evaluate the condition of fuse (Fn) accordingly.
Claims20
A semiconductor device having a fuse evaluation circuit, the fuse evaluation circuit comprising:
- at least one programmable fuse arranged in series with a controllable impedance path;
- and
- a control circuit varying the impedance of the controllable impedance path.
A semiconductor device having a fuse evaluation circuit for determining whether a fuse is in a first state or a second state, comprising:
- an evaluation node coupled to the fuse;
- an evaluation transistor coupled to the evaluation node, the evaluation transistor having a controllable impedance path;
- and
- a control circuit coupled to a control gate of the evaluation transistor to adjust the impedance of the controllable impedance path.
A semiconductor device having a fuse evaluation circuit, the fuse evaluation circuit comprising:
- a fuse circuit including a fuse coupled in series with an evaluation device to produce a evaluation potential at an evaluation node;
- a voltage generator for providing a control potential to control the impedance of the evaluation device during a first fuse evaluation mode;
- and
- a fuse evaluation control circuit for changing the control potential during a second fuse evaluation mode.
Dependencies are inferred from the claim text.