Method for forming and patterning film
AssigneeDenso Corporation
InventorsIchiharu Kondo, Yasuo Ishihara, Shuichi Nagahaka, Takeshi Miyajima
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AssigneeDenso Corporation
InventorsIchiharu Kondo, Yasuo Ishihara, Shuichi Nagahaka, Takeshi Miyajima
Estimating the term…
Metallic films are formed on a silicon substrate on which an insulation film and a conductive portion are exposed. The metallic films include a first metallic film directly contacting the insulation film and the conductive portion and a second metallic film disposed on the first metallic film as a stress adjustment film to control a stress at an interface between the first metallic film and the underlying member. Accordingly, an adhesion between the first metallic film and the insulation film can be controlled to be smaller than that between the first metallic film and the conductive portion. Then, the metallic film is removed from the insulation film by an adhesive sheet selectively while remaining on the conductive portion. As a result, the metallic film can be patterned stably and readily at low cost.
A method for manufacturing a semiconductor device, comprising:
A method for manufacturing a semiconductor device comprising:
A method of patterning a film, comprising:
A method for patterning a metallic film, comprising:
Dependencies are inferred from the claim text.