Traverse linearity compensation method and rotational accuracy compensation method of measuring device
AssigneeMitutoyo Corporation
InventorsEiji Okada, Yoshiyuki Omori, Atsushi Tsuruta, Tsukasa Kojima
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitutoyo Corporation
InventorsEiji Okada, Yoshiyuki Omori, Atsushi Tsuruta, Tsukasa Kojima
Estimating the term…
A compensation method according to the present invention includes: a traverse linearity data calculating step for measuring a master workpiece (MW) of which profile data is value-specified in advance while moving a sensor (7) using a linear movement mechanism (4, 5) of a measuring device (1) and for subtracting the previously value-specified profile data from the measurement data of the master workpiece to obtain a traverse linearity data of the linear movement mechanism; a workpiece measurement data calculating step for measuring the workpiece while moving the sensor by the linear movement mechanism of the measuring device to obtain a measurement data of the workpiece; and a workpiece profile calculating step for subtracting the traverse linearity data from the workpiece measurement data to obtain a true value data of the workpiece.
A traverse linearity compensation method of a measuring device having a linear movement mechanism, the method comprising:
A rotational accuracy compensation method of a measuring device having a rotary mechanism, the method comprising:
Dependencies are inferred from the claim text.