Configuration and parameterization system for diagnostic devices and associated method

Abstract

The invention is directed to a system and a method for the configuration and/or parameterization of diagnostic devices for test objects. The system includes a first data object having a collection of technological test object parameters of the test object and its components, and a second data object having a collection of technological parameters of hardware components of the diagnostic device. The system further includes a first program object containing data sentences for the assignment of at least test object parameters and technological parameters of hardware components, and a second program object for processing the data sentences assigned in the first program object. Via the data and program objects, a knowledge base is created that results in a configuration mainly automatically controlled by the knowledge of the system and/or parameterization of the diagnostic device including the test structure and evaluation. In this manner, the cost of such preparations is significantly reduced.

Dependencies are inferred from the claim text.