Apparatus for determining the crystalline and polycrystalline materials of an item
AssigneeHeimann Systems GmbH
InventorsHermann Ries, Patricia Schall, Frank Cordes, Martin Hartick
Life of this patent
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Abstract
A diffraction apparatus (10) for determining crystalline and polycrystalline materials of an item in objects, preferably in luggage, having a collimation/detector arrangement (11) and an X-ray source (12) and which is mounted to be adjustable in an X-ray testing machine (13). The collimation/detector arrangement (13) is adjustable in height relative to the X-ray source (12), and the two are also laterally and synchronously adjustable via respective adjustment elements (5,6). The collimator (13) has a conically-expanding round slot (15), which simulates a predetermined angle (ΘM) of a scatter-beam path.
Claims6
An apparatus for determining crystalline and polycrystalline materials of an item in objects, comprising a diffraction apparatus with a collimator/detector arrangement;
- an X-ray source that emits a primary beam directed towards the collimation/detector arrangement;
- first adjustment elements for mounting the collimation/detector arrangement for adjustment both laterally and height-wise relative to the X-ray source;
- second adjustment elements for mounting the X-ray source for lateral adjustment;
- and a computer for controlling the first and second adjustment elements to move the x-ray source and collimation/detector arrangement in synchronism.
Dependencies are inferred from the claim text.