US 6,535,824 B1 · Sensor array-based system and method for rapid materials characterization

Abstract

A modular materials characterization apparatus includes a sensor array disposed on a substrate, with a standardized array and contact pad format; electronic test and measurement apparatus for sending electrical signals to and receiving electrical signals from the sensor array; an apparatus for making electrical contact to the sensors in the standardized array format; an apparatus for routing signals between one or more selected sensors and the electronic test and measurement apparatus and a computer including a computer readable having a computer program recorded therein for controlling the operator of the apparatus. The sensor array is preferably arranged in a standardized format used in combinatorial chemistry applications for rapid deposition of sample materials on the sensor array. The interconnection apparatus and sensor array and contact pad allow measurement of many different material properties by using substrates carrying different sensor types, with only minor modifications if any to the electronic test and measurement apparatus and test procedures. By using a sensor array that is separate from the electronic apparatus, and by including standardized contacting and signal routing apparatuses, the apparatus creates a modular “plug-and-play” system that eliminates the need for multiple materials characterization machines, and eliminates the need for application-specific active circuitry within the sensor arrays themselves. Further, the modular sensor array system can characterize large numbers of material samples rapidly, on the order of at least 50 samples per hour, reducing the time needed for screening of materials libraries.

Claims61

Dependent claims

A computer readable medium containing software for the control of the operation of an apparatus for characterizing one or more material properties for a plurality of samples, the software comprising:

instructions for selecting an array of sensors for measurement, each sensor of the array of sensors connected by a common substrate, the array of sensors associated with a combinatorial array of samples, the array of samples being combinatorially synthesized such that each sample of the array of samples is at least slightly different from other samples of the array of samples, each of the samples of the array of samples associated with at least one sensor of the array of sensors wherein the at least one sensor is different for each sample;
instructions for computing, selecting and setting of test equipment operating parameters, wherein the instructions result in discrete operating parameters used to drive the test equipment;
instructions for initiating a data gathering sequence, wherein the array of sensors are caused to measure a preselected property for each of the samples of the array of samples and wherein the preselected property is the same for each of the samples of the array of samples;
instructions for sending, receiving and monitoring signals sent to and received from the array of sensors;
instructions for processing signals received from the array of sensors, wherein a specific output is generated for each signal processed;
instructions for calculating arithmetic values corresponding to the preselected property of each of the samples of the array of samples using the specific output generated for each signal processed;
instructions for monitoring and storing the calculated arithmetic value, the raw data, and each specific output for each signal processed;
and
instructions for displaying the arithmetic value of each of the samples of the array of samples together thereby allowing comparisons between the preselected property of various samples of the array of samples.

6 more elements

A computer program product comprising a computer readable medium having computer program logic recorded thereon for enabling a processor in a computer system to analyze one or more material properties of a plurality of material samples, the computer program logic comprising:

inputting means for enabling a processor in a computer to receive and process operator input;
selecting means for enabling the processor to drive a selected sensor array using operator input received from the inputting means, each sensor of the array of sensors connected by a common substrate, the array of sensors associated with a combinatorial array of samples, the array of samples being combinatorially synthesized such that each sample of the array of samples is at least slightly different from other samples of the array of samples, each of the samples of the array of samples associated with at least one sensor of the array of sensors wherein the at least one sensor is different for each sample;
driving means for enabling the processor to drive test equipment using operator input received from the inputting means;
operating means for enabling the processor to execute a data gathering sequence, wherein the array of sensors are caused to measure a preselected property for each of the samples of the array of samples and wherein the preselected property is the same for each of the samples of the array of samples;
routing means for enabling communication between the operating means and the array of sensors;
processing means for enabling the processor to communicate with the operating means in analyzing data signals received by the operating means;
determining means for enabling the processor to determine an arithmetic value representing the preselected property using signals received from the operating means;
and
storing means for enabling the processor to store data gathered during gathering sequence, data generated by processing means, or the arithmetic value;
and
display means for displaying the arithmetic value of each of the samples of the array of samples together thereby allowing comparisons between the preselected property of various samples of the array of samples.

8 more elements

Dependencies are inferred from the claim text.

Sensor array-based system and method for rapid materials characterization

Life of this patent

Sensor array-based system and method for rapid materials characterization

Life of this patent

Abstract

Claims61