Metallurgical sample magazine
AssigneeLeica Microsystems Inc.
InventorArvid A. Casler
Life of this patent
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AssigneeLeica Microsystems Inc.
InventorArvid A. Casler
Estimating the term…
An accessory device for use with a microhardness tester to position a test surface of a sample in a focal plane of the microhardness tester is disclosed. The device comprises a frame having a base that attaches to a z-stage of a microhardness tester, and upstanding front and rear walls connected by a bridge wall spaced vertically from the base. The front and rear walls of the frame each have an inwardly protruding detent rail defining an engagement surface on an underside of the detent rail, wherein the respective engagement surfaces lie in a common plane that corresponds to the focal plane of an objective lens of the microhardness tester. A swivel stage is provided between the front and rear walls for carrying a test sample. The stage is movable automatically or manually to a test position wherein a test surface of the sample abuts with the engagement surfaces in the focal plane and a released position. The frame is preferably elongated in a lateral direction to slidably support a series of samples for successive testing.
A device for positioning a test surface of a sample in the focal plane of an objective lens of a microhardness tester having a z-stage adjustable in a z-axis direction relative to said objective lens, said device comprising:
Dependencies are inferred from the claim text.