X-ray reflectometer
AssigneeJordan Valley Applied Radiation Ltd.
InventorsBoris Yokhin, Alexander Dikopoltsev, Isaac Mazor, David Berman
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AssigneeJordan Valley Applied Radiation Ltd.
InventorsBoris Yokhin, Alexander Dikopoltsev, Isaac Mazor, David Berman
Estimating the term…
Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.
Apparatus for detecting radiation, comprising:
A method for detecting radiation, comprising:
Dependencies are inferred from the claim text.