Projection exposure apparatus and method
AssigneeNikon Corporation
InventorsTetsuo Taniguchi, Masayuki Murayama
Life of this patent
Estimating the term…
Loading patent…
AssigneeNikon Corporation
InventorsTetsuo Taniguchi, Masayuki Murayama
Estimating the term…
Pattern transfer can be performed with improved exposure accuracy, by reducing the contamination caused by the attachment of a photosensitive agent or the like on an optical member of a projection optical member or the like. The pattern transfer onto a substrate W is performed after cleaning the objective member OB disposed at a given position by a cleaning device 8 at the time when pattern transfer is not performed, or while making flow a gas in a space between the substrate W and the optical member OB by a contamination protection device 98. Alternatively, the optical member OB disposed at a given position is inspected for contamination by a contamination inspection device 84 at the time when pattern transfer is not performed, and the pattern transfer or the cleaning or replacement of the optical member is performed based on the result.
A projection exposure apparatus for transferring a pattern defined on a mask onto a substrate via a projection optical system, comprising:
A projection exposure apparatus for transferring a pattern defined on a mask onto a substrate via a projection optical system, comprising:
A projection exposure apparatus for transferring a pattern defined on a mask onto a substrate via a projection optical system, comprising:
A projection exposure method for transferring a pattern defined on a mask onto a substrate via a projection optical system, the method comprising:
A projection exposure method for transferring a pattern defined on a mask onto a substrate via a projection optical system, the method comprising:
A method for making a projection exposure apparatus for transferring a pattern defined on a mask onto the substrate via a projection optical system, the method comprising:
A method for assembling a projection exposure for transferring a pattern defined on a mask to a substrate via a projection optical system, the method comprising:
Dependencies are inferred from the claim text.