Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy

An apparatus for performing localized thermal analysis experiments, comprising:

• a sample holder in which to place a sample;
• means for generating a temperature program by using a temperature program having a constant component and an oscillatory component;
• a sample probe to apply a temperature in accordance with said temperature program to said sample at a particular location on the surface of said sample;
• a reference probe to apply the temperature to a reference;
• monitoring means for monitoring a physical parameter indicative of a thermal property of said sample at said particular location;
• and
• recording means for recording a signal representative of said physical parameter at said particular location.

An apparatus for performing sub-surface imaging of a sample, comprising:

• a stage on which to place the sample;
• a heating source to heat a particular location of said sample, wherein said heating source exposes said particular location to a temperature that has an oscillatory component corresponding to a depth below said surface at which to create an image of said sample;
• a sensor to detect a physical parameter indicative of the composition of the sample at said pre-determined depth;
• means for developing contrast in said image at a location corresponding to said particular location of said sample;
• and
• a display device for displaying said image.