Apparatus for X-ray analysis with a simplified detector motion

An apparatus for X-ray analysis, comprising

• a source (10) for X-rays (8) to be analyzed,
• an analysis crystal for wavelength analysis of the X-rays to be analyzed,
• and a detector for detecting the X-rays emanating from the analysis crystal,
• which analysis crystal is displaceably mounted relative to the source along a first straight line which passes through the source, so that during displacement the analysis crystal remains tangent to a Rowland circle which extends through the source of X-rays to be analyzed and has a fixed dimension which is determined by the crystal geometry,
• characterized in that
• the apparatus comprises a fixed measuring channel for allowing the detector to occupy a fixed position relative to the source during the measurement, and the apparatus lacks any mechanism for lemniscate motion.

X-ray analysis apparatus for conducting a small θ scan or an adjustment between single wavelength measurements, the apparatus comprising:

• a. a source for x-rays to be analyzed;
• b. an analysis crystal for wavelength analysis of the x-rays to be analyzed;
• c. a detector for detecting the x-rays emanating from the analysis crystal;
• and
• d. a crystal adjuster for first displacing the analysis crystal along a first straight line that passes through the source, the analysis crystal remaining tangent to a Rowland circle during the first displacement, the Rowland circle extending through the source of x-rays to be analyzed and having a fixed dimension that is determined by the crystal geometry;
• and
• e. a detector adjuster for second displacing the detector along a second straight line that passes through the source, which second straight line does not move during any measurement or adjustment,
• any such first and/or second displacement effectuating the scan or adjustment;
• whereby no mechanism for lemniscate motion is required for the scan or adjustment.

X-ray analysis apparatus for conducting a small θ scan or an adjustment between single wavelength measurements, the apparatus comprising:

• a. a source for x-rays to be analyzed;
• b. an analysis crystal for wavelength analysis of the x-rays to be analyzed;
• c. a detector for detecting the x-rays emanating from the analysis crystal, the detector and source being mounted so that the detector occupies a fixed position relative to the source during the scan or adjustment;
• and
• d. a crystal adjuster for displacing the analysis crystal along a straight line that passes through the source, the analysis crystal remaining tangent to a Rowland circle during the displacement, the Roland circle extending through the source and having a fixed dimension which is determined by the crystal geometry, the displacement effectuating the scan or adjustment;
• whereby no mechanism for lemniscate motion is required for the scan or adjustment.