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US 6,487,269 B2Granted
Apparatus for analysing a sample
AssigneeOxford Instruments Analytical Oy
InventorRobin John Anderson
Life of this patent
Estimating the term…
Abstract
Apparatus for analysing a sample comprises: a. A radiation source for generating a radiation beam; b. A sample holder for holding the sample in use; c. A polariser for polarising the radiation beam; d. A radiation beam selector for selectively exposing the sample to either the radiation beam or the polarised radiation beam; and, e. A detector for detecting radiation emitted by the sample.
Claims10
Apparatus for analysing a sample, the apparatus comprising:
- a. A radiation source for generating a radiation beam;
- b. A sample holder for holding the sample in use;
- c. A polariser for polarising the radiation beam;
- d. A radiation beam selector for selectively exposing the sample to either the radiation beam or the polarised radiation beam;
- and,
- e. A detector for detecting radiation emitted by the sample.
3 more elements
Dependencies are inferred from the claim text.