Back to results
US 6,486,731 B2Granted
Semiconductor integrated circuit device capable of externally monitoring internal voltage
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsKyoji Yamasaki, Takashi Itou
Life of this patent
Estimating the term…
Abstract
A test on a desired internal voltage is easily and accurately conducted without increasing current dissipation or the number of pads. A driving circuit receiving a reference voltage from a reference voltage generating circuit has a high input impedance and low output impedance, and generates a voltage substantially at the same voltage level as the reference voltage received, and transmits the generated voltage to a pad with a current driving capability larger than the driving current capability of the reference voltage generating circuit.
Claims14
A semiconductor integrated circuit device, comprising:
- at least one reference voltage generating means for generating a reference voltage at a predetermined voltage level;
- internal voltage generating means for comparing a voltage corresponding to the reference voltage from said at least one reference voltage generating means with a voltage on an internal supply line to adjust a level of the voltage on said internal supply line according to the result of comparison;
- a pad;
- and
- driving means provided between an output of said at least one reference voltage generating means and said pad, for receiving the reference voltage output from said at least one reference voltage generating means, generating a voltage substantially at a same voltage level as said reference voltage for transmission to said pad.
2 more elements
Dependencies are inferred from the claim text.