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US 6,486,689 B1Granted
Printed circuit board testing apparatus and probe device for use in the same
AssigneeNidec-Read Corporation
InventorHideo Nishikawa
Life of this patent
Estimating the term…
Abstract
A probe device is mounted on a circuit provided with a holder mountable to a circuit board testing apparatus, a contact needle attachable to the holder. The contact needle is operable to resiliently bend in a specified direction immediately after coming into contact with a circuit board. The bending absorbs a contact impact to ensure accurate measurement.
Claims6
A probe device for use in a circuit board testing apparatus for testing conductivity of a circuit board, the probe device comprising:
- a holder mountable to a circuit board testing apparatus, the holder including:
- a holding member made of an electrically insulating material;
- an electrode rod mounted in the holding member, the electrode rod extending in a direction inclined with respect to a normal line of the circuit board;
- and
- a socket removably attached on the electrode rod;
- a contact needle attachable to the holder, and operable to resiliently bend in a specified direction immediately after coming into contact with a circuit board, the contact needle being fixedly attached on the socket,
- a restraining member for restraining the contact needle,
- wherein the restraining member is made of an electrically conductive material, and includes a restraining portion for permitting the contact needle to come into contact with the restraining member when the contact needle is not in contact with the circuit board, and permitting the contact needle to go away from the restraining member when the contact needle bends after coming into contact with the circuit board, further comprising:
- a connecting wire for connecting the restraining member with the electrode rod;
- and
- a detector for detecting the current in the connecting wire.
8 more elements
A probe device for use in a circuit board testing apparatus for testing conductivity of a circuit board, the probe device comprising:
- a holder mounted on the testing apparatus to be driven thereby;
- a contact needle coupled with the holder to move therewith, the contact needle being made of resilient material and having a curved portion to elastically bend in a specified direction when the tip of the contact needle is depressed against the circuit board to be tested;
- a restraining member for restraining the contact needle in a manner to restrain the contact needle and prevent the movement of the contact needle while the contact needle is driven with the holder, but allow the bending of the needle when it is depressed against the circuit board;
- and
- wherein the restraining member having a triangular opening through which the contact needle passes in such a manner that the contact needle resiliently abuts against the restraining member at a corner of the triangular opening while the contact needle is allowed to bend opposite from the corner in the opening.
2 more elements
Dependencies are inferred from the claim text.