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AssigneeSTMicroelectronics S.r.l.
InventorsRong Yin, Mehdi Zamanian
Estimating the term…
A frequency test circuit (200) includes a built-in self test (BIST) circuit (212) which provides for testing of a frequency generating circuit such as an oscillator circuit (100). The test circuit (200) includes circuit stages (202-208) which help produce a reference signal (210) which has substantially the same frequency as that produced by the oscillator circuit (100) when it is operational. Since the low current oscillator circuit (100) can fail at any one of the divider or level shifting stages (106-112), the test circuit (200) can determine if the reference signal and the output signal of the oscillator have substantially the same frequency and produce a test condition signal indicative of either a pass or failed test at test port (214).
A built-in frequency test circuit used for testing a frequency generating circuit which produces an output frequency signal when the frequency generating circuit is operational, said built-in frequency test circuit comprising:
An integrated circuit comprising:
An integrated circuit comprising:
A built-in frequency test circuit used for testing a frequency generating circuit which produces an output frequency signal when the frequency generating circuit is operational, said built-in frequency test circuit comprising:
Dependencies are inferred from the claim text.