System and method for output track unit detection and safe storage tube removal
AssigneeAdvanced Micro Devices, Inc.
InventorsNaramitr Jitramas, Wattanapong Viriya, Watcharin Namkang
Life of this patent
Estimating the term…
Abstract
Systems and methods are disclosed for testing semiconductor devices, using a tester providing tested semiconductor devices to a device output track, which feeds the semiconductor devices into a storage tube. The tester selectively removes the storage tube from the output track when the tube is filled and when no device is in the output track proximate the semiconductor storage tube. In addition, the tester refrains from removing the storage tube from the output track when a semiconductor device is in the device output track proximate the storage tube, so as to prevent or reduce damage to semiconductor devices during removal of the storage tube from the output track.
Claims21
A test system for testing semiconductor devices, comprising:
- a semiconductor tester adapted to test semiconductor devices and to provide semiconductor devices to a device output track, wherein the device output track feeds the semiconductor devices into a semiconductor storage tube associated with the device output track;
- wherein the tester is adapted to selectively remove the semiconductor storage tube from the device output track when the storage tube is filled with semiconductor devices and when no semiconductor device is in the device output track proximate the semiconductor storage tube, and to refrain from removing the semiconductor storage tube from the device output track when a semiconductor device is in the device output track proximate the semiconductor storage tube, whereby damage to semiconductor devices during removal of the semiconductor storage tube from the device output track is reduced.
A method of operating a semiconductor device tester, comprising:
- providing semiconductor devices to a device output track associated with the tester;
- feeding semiconductor devices along the device output track into a semiconductor storage tube associated with the device output track;
- selectively removing the semiconductor storage tube from the device output track when the storage tube is filled with semiconductor devices and when no semiconductor device is in the device output track proximate the semiconductor storage tube;
- and
- refraining from removing the semiconductor storage tube from the device output track when a semiconductor device is in the device output track proximate the semiconductor storage tube, whereby damage to semiconductor devices during removal of the semiconductor storage tube from the device output track is reduced.
A system for testing semiconductor devices, comprising:
- a semiconductor tester adapted to test semiconductor devices and to provide semiconductor devices to a device output track, wherein the device output track feeds the semiconductor devices into a semiconductor storage tube associated with the device output track;
- and
- means for removing the semiconductor storage tube from the device output track when the storage tube is filled with semiconductor devices and when no semiconductor device is in the device output track proximate the semiconductor storage tube;
- and
- means for refraining from removing the semiconductor storage tube from the device output track when a semiconductor device is in the device output track proximate the semiconductor storage tube, whereby damage to semiconductor devices during removal of the semiconductor storage tube from the device output track is reduced.
Dependencies are inferred from the claim text.