Method of manufacturing dielectric ceramic composition and electronic device containing dielectric layer
AssigneeTDK Corporation
InventorsTakeshi Nomura, Shigeki Sato
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AssigneeTDK Corporation
InventorsTakeshi Nomura, Shigeki Sato
Estimating the term…
A method of manufacturing a dielectric ceramic composition comprising at least a main component of BaTiO3, a second subcomponent as represented by (Ba, Ca)xSiO2+x (where, x=0.8 to 1.2), and other subcomponents. The main component and at least part of the subcomponents except the second subcomponent are mixed to prepare a pre-calcination powder and the pre-calcination powder is calcined to prepare a calcined powder. The second subcomponent is at least mixed in the calcined powder to obtain a dielectric ceramic composition having a ratio of each subcomponent to the main component of BaTiO3 of a predetermined molar ratio. It is therefore possible to obtain an electronic device containing a dielectric layer such as a multi-layer ceramic capacitor able to satisfy both of the capacity-temperature characteristics of the X7R characteristic (EIA standard) and the B characteristic (EIAJ standard), even when the dielectric layer is a superthin one of not more than 4 μm and having a small change in the capacity under a DC electric field along with time and further having a long accelerated lifetime of the insulation resistance and a small drop in capacity under a DC bias.
A method of manufacturing a dielectric ceramic composition comprising:
A method of manufacturing a multi-layer ceramic capacitor comprised of an internal electrode comprised of Ni or an Ni alloy and a dielectric layer alternately stacked, the dielectric layer including by molar ratio 100 moles of BaTiO3, 0.1 to 3 moles of at least one type of MgO and CaO, 0.05 to 1.0 mole of MnO, 0.1 to 5 moles of Y2O3, 0.1 to 3 mole of V2O5, and 2 to 12 moles of BaaCa1−aSiO3 (where “a” is a number of 0 to 1), comprising:
A method of manufacturing a multi-layer ceramic capacitor comprised of an internal electrode comprised of Ni or an Ni alloy and a dielectric layer alternately stacked, the dielectric layer including by molar ratio 100 moles of BaTiO3, 0.1 to 3 moles of at least one type of MgO and CaO, 0.05 to 1.0 mole of MnO, 0.1 to 5 moles of Y2O3, 0.1 to 3 mole of V2O5, and 2 to 12 moles of BaaCa1−aSiO3 (where “a” is a number of 0 to 1), comprising:
Dependencies are inferred from the claim text.