Sputtering method utilizing an extended plasma region
AssigneeApplied Materials, Inc.
InventorsJianming Fu, Praburam Gopalraja
Life of this patent
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Abstract
A target and magnetron for a plasma sputter reactor and the associated sputtering method provided by the extended magnetic fields and plasma regions. The target has an annular vault facing the wafer to be sputter coated. Various types of magnetic means positioned around the vault, some of which may rotate along the vault, create a magnetic field in the vault to support a plasma extending over a large volume of the vault from its top to its bottom. The large plasma volume increases the probability that the sputtered metal atoms will become ionized and be accelerated towards an electrically biased wafer support electrode.
Claims11
A magnetron sputtering method, comprising the steps of:
- providing a vault-shaped target electrically isolated from a plasma sputtering chamber including a support surface for a substrate to be sputter coated, said vault-shaped having a vault annular about a central axis and disposed on a first side of said target facing said support surface and a well disposed on a back side of said target inside said vault, said vault having an annular inner sidewall, an opposed annular outer sidewall, and a top wall, an aspect ratio of a depth of said vault to a width of said vault being at least 1:2, said target being continuous within said vault and in an area between said inner sidewall facing said support surface;
- supplying electrical power to said vault-shaped target to create a plasma within said plasma sputtering chamber;
- and
- impressing a magnetic field within said vault including impressing first magnetic field lines within said vault, each line within said vault entering and leaving said vault between different portions of said inner sidewall and second magnetic field lines within said vault each entering and leaving said vault between different portions of said outer sidewall, wherein said impressing step impresses third magnetic field lines in said vault, each entering and leaving said vault between different portions of said top wall.
A sputtering method, comprising the steps of:
- electrically isolating a continuous vault-shaped target from a plasma sputtering chamber including a pedestal for supporting a substrate to be sputter coated, said vault-shaped having a vault annular about a central axis and disposed on a first side of said target facing said pedestal, said vault having an annular inner sidewall, an opposed annular outer sidewall, and a top wall, an aspect ratio of a depth of said vault to a width of said vault being at least 1:2;
- rotating a magnetic assembly adjacent said vault about said central axis, wherein said magnetic assembly includes two permanent magnets of opposed polarities positioned on a side of said top wall opposite said vault;
- and
- applying DC electrical power to said target to excite a plasma within said plasma sputtering chamber.
A sputtering method in a plasma sputtering chamber arranged about a central axis and including a support surface for a substrate to be sputter coated and a vault-shaped target electrically isolated from said chamber and arranged in opposition to said support surface along said central axis and having a vault which is annular about said central axis and disposed on a first side of said target facing said support surface, said vault having an annular inner sidewall, an opposed annular outer sidewall, and a top wall, said target being continuous within said vault and in an area between said inner sidewall facing said support surface, said method comprising the steps of:
- supplying electrical power to said vault-shaped target to create a plasma within said plasma sputtering chamber;
- a first step of impressing a first magnetic field inside said vault having first magnetic field lines adjacent said outer sidewall with components of a first magnetic direction along said central axis;
- and
- a second step of impressing a second magnetic field inside said vault having second magnetic field lines adjacent said inner sidewall with components of a second magnetic direction along said central axis opposite said first magnetic direction.
Dependencies are inferred from the claim text.