Shroud retention wafer
AssigneeFCI Americas Technology, Inc.
InventorRay C. Doutrich
Life of this patent
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AssigneeFCI Americas Technology, Inc.
InventorRay C. Doutrich
Estimating the term…
An insulative shroud retention wafer for an electrical connector allowing for an optimization of pin placements of the electrical connector is provided. In an illustrative embodiment the shroud retention wafer comprises a first (66), second (68), third (70), and fourth (72) cylindrical members, each having an axial pin receiving aperture (86) and an axial center line (78, 80) extending through the pin receiving aperture (86). Furthermore, the cylindrical members maintain at least one protuberance (100). In operation, the cylindrical members of the shroud retention wafer couple with pins of the electrical connector to realize an electrical connection. Specifically, the protuberance (100) causes collapse of the cylinders (66,68,70,72) allowing for better gripping of pins of the electrical connector. The arrangement of the cylinders (66,68,70,72) of the shroud retention (28) wafer maximizes the number of cylindrical members on the wafer allowing for optimization of pin placement.
An insulative shroud retention wafer comprising:
An insulative shroud retention wafer comprising:
An insulative shroud retention wafer comprising:
An insulative shroud retention wafer comprising a planar base member having a plurality of members extending from said planar base, each member having an axial pin receiving aperture that accept contact pins from cooperating electrical connectors, and protuberances located peripherally to said members, wherein the location of the protuberances provide a retention force on said electrical connector contact pins by engaging pin housing members offered by said cooperating electrical connectors, said retention force protecting against deforming of said electrical connector contact pins.
Dependencies are inferred from the claim text.