Coin inspection method and device
AssigneeKabushiki Kaisha Nippon Conlux
InventorMasanori Sugata
Life of this patent
Estimating the term…
Abstract
A coin inspection method and a device which can inspect a coin with a high precision, by extracting a large amount of information from a sensor detection signal waveform. In coin inspection which is performed based on a detection signal waveform of a magnetic sensor disposed along a coin pathway through which the coin passes, a differential waveform of the detection signal waveform is determined, first information indicating a peak position of the differential waveform, second information indicating a value of the detection signal waveform at the peak position of the differential waveform, and third information indicating a value of the differential waveform at the peak position of the differential waveform are extracted, and the extracted first through third information are used to inspect the coin.
Claims22
A coin inspection method, in which a sensor is positioned along a coin pathway through which a coin passes, and inspection of the coin is performed based on a detection signal waveform of the sensor;
- comprising the steps of:
- determining a differential waveform of the detection signal waveform;
- extracting first information indicating a peak position of the differential waveform, second information indicating a value of the detection signal waveform at the peak position of the differential waveform, and third information indicating a value of the differential waveform at the peak position of the differential waveform;
- and
- inspecting the coin by using the first through third information.
A coin inspection method, in which a sensor is positioned along a coin pathway through which a coin passes, and inspection of the coin is performed based on a detection signal waveform of the sensor;
- comprising the steps of:
- determining a differential waveform of the detection signal waveform;
- and
- inspecting the coin by using, as inspection information, a characteristic quantity of the differential waveform in a specific region.
A coin inspection device, in which a sensor is positioned along a coin pathway through which a coin passes and the coin is inspected based on a detection signal waveform of the sensor, comprising:
- differential processing means for determining a differential waveform of the detection signal waveform;
- information extraction means for extracting first information indicating a peak position of the differential waveform obtained by the differential processing means, second information indicating a value of the detection signal waveform at the peak position of the differential waveform, and third information indicating a value of the differential waveform at the peak position of the differential waveform;
- and,
- inspection means for inspecting the coin based on the first through third information.
A coin inspection device in which a sensor is positioned along a coin pathway through which a coin passes, and the coin is inspected based on a detection signal waveform of the sensor, comprising:
- differential processing means for determining a differential waveform of the detection signal waveform;
- and
- coin inspection means for inspecting the coin, using, as inspection information, a characteristic quantity in a specific region of the differential waveform determined by the differential processing means.
Dependencies are inferred from the claim text.