Electron beam energy filter
AssigneeJEOL Ltd.
InventorToshikatsu Kaneyama
Life of this patent
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AssigneeJEOL Ltd.
InventorToshikatsu Kaneyama
Estimating the term…
There is disclosed an energy filter for use in an electron microscope, the energy filter having an electron passage that can be evacuated more reliably than heretofore. The filter can be designed compactly without increasing the polepiece gaps or the spaces to accommodate coils. The energy filter has an electron-deflecting magnet assembly. This assembly comprises a pair of opposite polepiece bases, a pair of spacers interposed between the polepiece bases, and a yoke mounted to side surfaces of the polepiece bases. Magnetic polepieces and coil grooves of a given width are formed in the opposite surfaces of the polepiece bases. Bulges forming shunts are formed outside the coil grooves in the polepiece bases. O-ring grooves are formed in the spacers on the sides of the polepiece bases around the coil grooves. Electron passage grooves are formed in the opposite surfaces of the spacers to form the electron passage.
An energy filter consisting of at least one magnet assembly and mounted within a vacuum created inside an electron microscope, said energy filter arranged to receive incident electrons including electrons having a given energy, said energy filter acting to pass the electrons having said given energy, said energy filter comprising:
Dependencies are inferred from the claim text.