Method for minimizing total test time for testing factories
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMing-Hsiu Hsieh, Fu-Kang Lai, Wen-Feng Wu, Yi-Hsin Chan, Yao-Tung Liu, Yi-Chin Hsu
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMing-Hsiu Hsieh, Fu-Kang Lai, Wen-Feng Wu, Yi-Hsin Chan, Yao-Tung Liu, Yi-Chin Hsu
Estimating the term…
To allocate products for machines on a manufacturing line, provide a standard test time. Minimize total test time with respect to production scheduling. Form a supply demand matrix table for products and machines for product allocation. Find the grid location with minimum testing time. Provide maximum time allocation from a machine at the corresponding position on the matrix table. Determine the grid location with the next minimum testing time. Loop back to provide a maximum allocation of remaining time from the corresponding machine and repeat looping back until no demand is left. Find need for an optimum testing process by testing whether only one machine can test the product and no quantity is allocated to a machine. If YES branch to calculate utilization per machine. If NO, decide whether NCOL+NLIN−1=NVB. If YES perform optimum testing. If NO, branch to calculate machine utilization per machine.
A method for allocating products to be tested to machines on a manufacturing line comprising:
A system for allocating products to be tested to machines on a manufacturing line including:
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