Input sub-ranging converter system for sampling semiconductor temperature sensors
AssigneeNational Semiconductor Corporation
InventorMehmet Aslan
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AssigneeNational Semiconductor Corporation
InventorMehmet Aslan
Estimating the term…
A converter system for a temperature sensor includes a programmable current source, a digital-to-analog converter, a summer, and an analog-to-digital converter. The temperature sensor provides a measurement voltage in response to application of a bias current. The programmable current source selectively provides two different currents to the temperature sensor such that the temperature sensor provides two measurement voltages during a given temperature measurement. The digital-to-analog converter (DAC) provides an intermediate voltage that corresponds to an approximation of a voltage between the two voltages. A summer is configured to produce an offset measurement in response to the intermediate voltage and the measurement voltage. The analog-to-digital converter (ADC) receives the offset measurement voltage and produces a conversion code. Offsetting the measurement voltage reduces the dynamic range requirements of the ADC such that substantially a full input range of the ADC is utilized.
A method of sampling a response voltage from a temperature sensor that includes a PN junction, the method comprising:
An apparatus for sampling response voltages from a temperature sensor that includes a PN junction, comprising:
An apparatus for sampling response voltages from a temperature sensor that includes a PN junction, comprising:
Dependencies are inferred from the claim text.