Phase digitizer
AssigneeAgilent Technologies, Inc.
InventorDavid C. Chu
Life of this patent
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Abstract
A system and method of digitizing characteristic parameters of a quasi-sinusoidal analog signal of unknown magnitude, frequency and phase-offset, includes digitizing the analog signal at a first sampling rate, thereby generating a plurality of sets of digital signal waveform samples. Successive sets of the digital signal waveform samples are digitally processed to generate continually updated digital characteristic parameters representing a characteristic behavior of the quasi-sinusoidal analog signal.
Claims34
A method of digitizing characteristic parameters of a quasi-sinusoidal analog signal of unknown magnitude, frequency and phase-offset, the method comprising:
- digitizing the analog signal at a first sampling rate, thereby generating a plurality of sets of digital signal waveform samples;
- and
- digitally processing successive sets of the digital signal waveform samples to generate continually updated digital characteristic parameters representing a characteristic behavior of the quasi-sinusoidal analog signal.
A phase digitizing system comprising:
- an analog-to-digital converter for generating a plurality of segments of digital signal waveform samples based on an incoming analog signal;
- a digital phase accumulator;
- and
- a digital signal processor coupled to the analog-to-digital converter and the phase accumulator for digitally processing each segment of the digital signal waveform samples together with output of the phase accumulator and continually generating digital phase data, the digital signal processor configured to provide increment values to the digital phase accumulator based on the digital phase data, thereby causing the output of the digital phase accumulator to represent an instantaneous phase of the incoming analog signal.
A displacement measuring interferometry system comprising:
- a light source for generating at least one light beam;
- an interferometer for generating an optical measurement signal based on the at least one light beam;
- a receiver for receiving the optical measurement signal and an optical reference signal, the receiver configured to generate an analog measurement signal based on the optical measurement signal and configured to generate an analog reference signal based on the optical reference signal;
- at least one analog-to-digital converter for generating a plurality of sets of digital measurement signal waveform samples based on the analog measurement signal, the at least one analog-to-digital converter configured to generate a plurality of sets of digital reference signal samples based on the analog reference signal;
- and
- at least one digital signal processor coupled to the at least one analog-to-digital converter for digitally processing each set of the digital measurement signal waveform samples and the digital reference signal waveform samples, the at least one digital signal processor configured to generate digital measurement phase data representing an instantaneous phase of the analog measurement signal, the at least one digital signal processor configured to generate digital reference phase data representing an instantaneous phase of the analog reference signal.
Dependencies are inferred from the claim text.