Method and apparatus for testing thin-film magnetic head
AssigneeTDK Corporation
InventorsNozomu Hachisuka, Katsuhiko Tomita
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Abstract
A method for testing a thin-film magnetic head with a MR read head element includes a step of applying a low-frequency or DC external magnetic field to the thin-film magnetic head from a stationary magnetic field generation unit, a step of executing a high-frequency amplification of an output from the MR read head element under the application of the external magnetic field to provide a high-frequency amplified signal, a step of deriving only a high-frequency component from the high-frequency amplified signal to provide a high-frequency component signal, and a step of judging whether the thin-film magnetic head occurs a noise or not by using the high-frequency component signal.
Claims8
A method for testing a thin-film magnetic head with a magnetoresistive effect read head element, said method comprising the steps of:
- applying a low frequency or DC external magnetic field to said thin-film magnetic head from a stationary magnetic field generation means;
- executing a high-frequency amplification of an output from said magnetoresistive effect read head element under the application of the external magnetic field to provide a high-frequency amplified signal;
- deriving only a high-frequency component from said high-frequency amplified signal to provide a high-frequency component signal;
- and
- judging whether said thin-film magnetic head occurs a noise or not by using said high-frequency component signal.
An apparatus for testing a thin-film magnetic head with a magnetoresistive effect read head element, comprising:
- a stationary magnetic field generation means for applying a low frequency or DC external magnetic field to said thin-film magnetic head;
- a high-frequency amplification means for amplifying an output from said magnetoresistive effect read head element under the application of the external magnetic field to provide a high-frequency amplified signal;
- a high-pass means for deriving only a high-frequency component from said high-frequency amplified signal to provide a high-frequency component signal;
- and
- a judgment means for judging whether said thin-film magnetic head occurs a noise or not by using said high-frequency component signal.
Dependencies are inferred from the claim text.