Method and apparatus for generating expect data from a captured bit pattern, and memory device using same
AssigneeMicron Technology, Inc.
InventorTroy A. Manning
Life of this patent
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AssigneeMicron Technology, Inc.
InventorTroy A. Manning
Estimating the term…
Expect data signals are generated for a series of applied data signals having a known sequence to determine if groups of the data signals were properly captured. A first group of the applied data signals is captured, and a group of expect data signals generated from the captured first group. A second group of applied data signals is then captured and determined to have been properly captured when the second group corresponds to the group of expect data signals. In this way, when a captured series of data signals is shifted in time from an expected capture point, subsequent captured data signals are compared to their correct expected data signals in order to determine whether the group, although shifted in time, was nonetheless correctly captured. A pattern generator generates expect data signals in this manner, and may be utilized in in a variety of integrated circuits, such as an SLDRAM.
An integrated circuit having a plurality of external terminals adapted to receive respective signals, comprising:
A packetized dynamic random access memory, comprising:
A computer system, comprising:
Dependencies are inferred from the claim text.