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US 6,477,275 B1Granted
Systems and methods for locating a pattern in an image
AssigneeCoreco Imaging, Inc.
InventorsSimon H. Melikian, Rohit G. Israni
Life of this patent
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AssigneeCoreco Imaging, Inc.
InventorsSimon H. Melikian, Rohit G. Israni
Estimating the term…
In one aspect the invention provides processes for locating a pattern within an image that can comprise the acts of providing a template representative of the pattern to be located within an image. The image can be subdivided into a plurality of sub-images, each being representative of a portion of the image. The process can then compare each of the sub-images to the template to generate a plurality of score signals representative of a location of the pattern, and can then process the score signals to determine a location for the pattern. In one practice, the step of processing the score signals can include a step of identifying at least one sub-image that includes a degraded image. As described above, a degraded image can include an image that has had a portion obscured by shadows or debris. Additionally, an image can be degraded at spots of high-reflection that create glare and wash-out portions of the image.
A process for locating a pattern within an image, comprising:
A system for locating a pattern within an image, comprising:
A process for determining the location of an object, comprising
Dependencies are inferred from the claim text.