Method for reading semiconductor die information in a parallel test and burn-in system

A program storage device readable by machine, tangibly embodying a program of instructions executable by the machine to perform method steps for determining memory device identification, the method steps comprising:

• invoking a serial output from n identification fuses of a plurality of devices, the serial output for identifying the devices;
• sampling the serial output every nth bit to determine a fuse state for a fuse of each device;
• repeating the sampling for all n fuses to acquire fuse data for all devices;
• and
• determining a pass/fail string corresponding to the sampled output, the pass/fail string being employed to identify through a parallel test and burn-in system, wherein the sampled output is on an enabled data line also used for a burn-in test wherein other data lines disabled for avoiding bus contention.

A system for determining memory device identification, comprising:

• a testing board to which a plurality of memory devices are wired in parallel, each memory device including one or more identification fuses;
• a strobe for sampling and comparing an output from the plurality of memory devices on an enabled package pin to an expected data, wherein the enabled package pin is used for burn-in testing wherein other pins are disabled for avoiding bus contention;
• and
• a memory for storing the results of the comparison.