Circuits and methods for a static random access memory using vertical transistors
AssigneeMicron Technology, Inc.
InventorWendell P. Noble
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AssigneeMicron Technology, Inc.
InventorWendell P. Noble
Estimating the term…
A memory cell. The memory cell has a flip-flop that includes a cross-coupled pair of inverters. The inverters each include a pair of complementary, vertical transistors. A gate contact interconnects the gates of the inverters and acts as the input of the inverter. A shunt interconnects a first source/drain region of the complementary transistors and acts as the output of the inverter. A first vertical, access transistor is also included. The first vertical, access transistor has a gate that is coupled to a word line, a first source/drain region that is coupled to the output of one of the inverters, and a second source/drain region that is coupled to a first bit line. A second vertical, access transistor is also provided. The second vertical, access transistor has a gate that is coupled to the word line, a first source/drain region that is coupled to the output of the other inverter, and a second source/drain region that is coupled to a second bit line.
A method for forming a memory cell, the method comprising:
A method of forming a memory cell, comprising:
A method of forming a memory cell, comprising:
A method of forming a memory cell, comprising:
A method of forming a memory device, comprising:
A method of forming a memory device, comprising:
A method of forming a memory device, comprising:
A method of forming a memory cell, comprising:
A method of forming a memory cell, comprising:
A method of forming a memory cell, comprising:
A method of forming a memory device, comprising:
A method of forming a memory device, comprising:
A method of forming a memory device, comprising:
Dependencies are inferred from the claim text.