Method of measuring surface form of semiconductor thin film
AssigneeOki Electric Industry Co., Ltd.
InventorMakoto Nakazawa
Life of this patent
Estimating the term…
Abstract
The surface form of a semiconductor thin film such as a polysilicon film 13 formed on a semiconductor substrate 11 is measured through spectro-ellipsometry or measured by performing an IPA quantitative analysis through GC. Mass (gas chromatography) after exposing the semiconductor thin film to IPA (isopropyl alcohol) vapor and drying the semiconductor thin film. Through either of these methods the surface form of the polysilicon film easily and quickly measured.
Claims8
A method of measuring a surface form of a semiconductor thin film formed at a surface of a semiconductor substrate, comprising:
- developing a plurality of models of the semiconductor thin film, the developing of each model comprising
- preparing a graph representing a relationship between tan φ and measurement wavelengths and a graph representing a relationship between cos Δ and measured wavelengths for said semiconductor film thin, using spectroellipsometry,
- whereby tan φ is a ratio of an amplitude reflection coefficient of a first polarized light component to an amplitude reflection coefficient of a second polarized light component, and cos Δ is a phase difference between the first polarized light component and the second polarized light component, during the spectroellipsometry;
- optimizing film thickness of said semiconductor thin film by optimizing a coefficient in a Cauchy model function on a premise that five film layers are laminated on said surface of said semiconductor substrate and values for film thicknesses T1, T2, T3, and T4 and void rates V1, V2, V3 and V4 respectively corresponding to a first layer, a second layer, a third layer and a fourth layer of the five film layers of said semiconductor thin film starting from a side toward said semiconductor thin film surface are ascertained, by fitting the optimized film thickness in said graph representing the relationship between tan φ and measurement wavelengths and said graph representing the relationship between cos Δ and measurement wavelengths;
- and
- substituting the values ascertained for film thicknesses T1, T2, T3 and T4 and void rates V1, V2, V3 and V4 in the following expression to calculate a total void rate X
- X=(T1×V1+T2×V2+T3×V3)/(T1+T2+T3),
- and
- determining the surface form of said semiconductor thin film based upon a correlation between the total void rate X of each model and a measured total void rate of said semiconductor thin film.
A method of measuring a surface form of a semiconductor thin film formed at a surface of a substrate, comprising:
- dividing said semiconductor thin film into n layers, wherein n is an integer equal to or larger than 2;
- irradiating a polarized light beam containing a P polarized light component and an S polarized light component on said semiconductor thin film by changing a wavelength thereof;
- measuring a ratio of an amplitude reflection coefficient of the P polarized light component and an amplitude reflection coefficient of the S polarized light component in said polarized light beam and a phase difference between the P polarized light component and the S polarized light component in said polarized light beam over an entire wavelength range of said polarized light beam;
- ascertaining standard film thicknesses and standard concentrations for individual layers constituting said semiconductor thin film, so as to approximate said ratio of the amplitude reflection coefficients and said phase difference obtained through the measurement to simulation data obtained by using a model;
- ascertaining void rates of said individual layers in correspondence to said standard film thicknesses and said standard concentration of layers;
- and
- calculating a total void rate X of said semiconductor thin film based upon said void rates of said layers.
Dependencies are inferred from the claim text.