Method of sorting monolithic ceramic capacitors by measuring the insulation resistance thereof

A method for sorting of monolithic ceramic capacitors having a rated insulation resistance and a rated operating voltage, comprising the steps of:

• applying not less than double the rated operating voltage at a maximum working temperature to a monolithic ceramic capacitor to be sorted as a burn-in process step;
• and
• measuring an insulation resistance across the capacitor while applying not less than the rated voltage at a temperature of not less than 70° C. to the monolithic ceramic capacitor as a high temperature insulation resistance measuring process step, comparing the measured insulation resistance to the rated resistance corresponding to the capacitor whereby a monolithic ceramic capacitor having an abnormal insulation resistance may be detected, and wherein the burn-in process and the high temperature insulation resistance measuring process are performed as continuous processes and wherein the direction of applied voltage to the monolithic ceramic capacitor in the burn-in process agrees with the direction of applied voltage to the monolithic ceramic capacitor in the high temperature insulation resistance measuring process.

A method for sorting of monolithic ceramic capacitors having a rated insulation resistance and a rated operating voltage, comprising the steps of:

• applying not less than double the rated operating voltage at a maximum working temperature to a monolithic ceramic capacitor to be sorted as a burn-in process step;
• and
• measuring an insulation resistance across the capacitor while applying not less than the rated voltage at a temperature of not less than 70° C. to the monolithic ceramic capacitor as a high temperature insulation resistance measuring process step, comparing the measured insulation resistance to the rated resistance corresponding to the capacitor whereby a monolithic ceramic capacitor having an abnormal insulation resistance may be detected, and wherein the burn-in process is not performed before the high temperature insulation resistance measuring process and the burn-in process and the high temperature insulation resistance measuring process are performed as continuous processes, and the direction of applied voltage to the monolithic ceramic capacitor in the burn-in process agrees with the direction of applied voltage to the monolithic ceramic capacitor in the high temperature insulation resistance measuring process.

A method for sorting of monolithic ceramic capacitors having a rated insulation resistance and a rated operating voltage, comprising the steps of:

• applying not less than double the rated operating voltage at a maximum working temperature to a monolithic ceramic capacitor to be sorted as a burn-in process step;
• and
• measuring an insulation resistance across the capacitor while applying not less than the rated voltage at a temperature of not less than 70° C. to the monolithic ceramic capacitor as a high temperature insulation resistance measuring process step, comparing the measured insulation resistance to the rated resistance corresponding to the capacitor whereby a monolithic ceramic capacitor having an abnormal insulation resistance may be detected, and wherein the high temperature insulation resistance measuring process is performed after the burn-in process without measuring an insulation resistance at room temperature, the burn-in process and the high temperature insulation resistance measuring process are performed as continuous processes, and the direction of applied voltage to the monolithic ceramic capacitor in the burn-in process agrees with the direction of applied voltage to the monolithic ceramic capacitor in the high temperature insulation resistance measuring process.

A method for sorting of monolithic ceramic capacitors having a rated insulation resistance and a rated operating voltage, comprising the steps of:

• applying not less than double the rated operating voltage at a maximum working temperature to a monolithic ceramic capacitor to be sorted as a burn-in process step;
• and
• measuring an insulation resistance across the capacitor while applying not less than the rated voltage at a temperature of not less than 70° C. to the monolithic ceramic capacitor as a high temperature insulation resistance measuring process step, comparing the measured insulation resistance to the rated resistance corresponding to the capacitor whereby a monolithic ceramic capacitor having an abnormal insulation resistance may be detected, and wherein the direction of applied voltage to the monolithic ceramic capacitor in the burn-in process agrees with the direction of the applied voltage to the monolithic ceramic capacitor in the high temperature insulation resistance measuring process.