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AssigneeSTMicroelectronics S.r.l.
InventorsRoland Marbot, Pascal Couteaux, Reza Nezamzadeh
Estimating the term…
A testing device for testing dynamic characteristics of an electronic circuit using serial transmissions. The circuit includes a multiplexing device and a demultiplexing device for implementing a serial link in the component or circuit. The testing device includes a transmitter for transmitting binary signals to the multiplexing device, a receiver for receiving binary signals from the demultiplexing device, and a link for selectively providing a coupling between the transmitter and the receiver. Additionally, a clock generator delivers a first clock signal to the transmitter and a second clock signal, which has a different frequency than the first clock signal, to the receiver. In one preferred embodiment, the clock generator includes a single programmable-frequency oscillator and a variable delay circuit. The programmable-frequency oscillator delivers the first clock signal and the variable delay circuit delays the first clock signal to deliver the second clock signal. The testing device can be used with circuits operating at frequencies in the range of 100 MHz. A method of testing dynamic characteristics of an electronic circuit using a testing device is also provided.
A testing device for testing dynamic characteristics of an electronic component or circuit using serial transmissions, the component or circuit including a multiplexing device and a demultiplexing device for implementing a serial link in the component or circuit, said testing device comprising:
A data processing system comprising:
A method of testing dynamic characteristics of an electronic circuit using a testing device, the circuit including a multiplexing device and a demultiplexing device for implementing a link in the circuit, said method comprising the steps of:
Dependencies are inferred from the claim text.