Method and apparatus for analyzing impurities in gases
AssigneeNippon Sanso Corporation
InventorsAkira Nishina, Makoto Tanaka, Tetsuya Satou
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Abstract
There are provided a method and an apparatus capable of accurately analyzing impurity component having high adsorptivity or reactivity in a short time. Prior to starting measurement, predetermined amount of sample gas is introduced into analyzing system in plural times with predetermined time interval and then, analysis of impurities is started.
Claims2
A method of conditioning an analyzing system for analyzing impurities in a sample gas, the system comprising chromatographic columns for separating the impurities inside the columns and a detector for detecting said separated impurities wherein the system is conditioned before starting the analysis of said impurities with the detector by saturating the system with the sample gas by releasing predetermined amounts of the sample gas in the system a plurality of times at predetermined time intervals while the detector is in a non-operative state.
An apparatus for carrying out the method of claims 3, including an analyzing system comprising chromatographic columns for separating impurities in a sample gas and a detector for analyzing said separated impurities, said apparatus further comprising;
- a sample gas introducing passage which diverges into a plurality of passages, each passage having a column and a sampling valve for metering and Supplying said sample gas into the column, and
- a switch valve for switching gas flowing out from any one of said columns into an analyzing passage for supplying said gas into said detector, and switching gas flowing out from another of said columns into an exhaust passage for exhausting said gas outside of the analyzing system wherein said switch valve is provided downstream of said columns.
Dependencies are inferred from the claim text.