Refresh method capable of reducing memory cell access time in semiconductor memory device
AssigneeSamsung Electronics Co., Ltd.
InventorsSeong-kue Jo, Jong-yul Park
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AssigneeSamsung Electronics Co., Ltd.
InventorsSeong-kue Jo, Jong-yul Park
Estimating the term…
A refresh method for a semiconductor memory device capable of reducing memory cell access time and performing refresh operation is provided. In the refresh method for a semiconductor memory device, when refresh operation is requested, the low address for the refresh operation is latched, and it is determined whether a normal operation command is inputted into the semiconductor memory device. If the normal operation command is inputted into the device, block selection bits of a low address for normal operation is compared with block selection bits of the latched low address for the refresh operation. When block selection bits of both low addresses are the same, a word line for the refresh operation is activated by decoding the latched low address for the refresh operation. A word line for the normal operation is activated by simultaneously decoding the low address for the normal operation while the latched low address for refresh operation is decoded. That is, the normal operation and the refresh operation are simultaneously performed.
A refresh method for a semiconductor memory device comprising the steps of:
A refresh method for a semiconductor memory device comprising the steps of:
A refresh method for a semiconductor memory device comprising the steps of:
Dependencies are inferred from the claim text.