Alignment free interferometer and alignment free method of profiling object surfaces

An interferometer assembly, comprising:

• a radiation source for emitting a beam along a first path;
• a first retroreflector assembly, comprising:
• a beamsplitter panel in said first path of said beam;
• a reflecting panel having a reflecting surface in reflecting relation with said beamsplitter panel;
• and
• a support panel having a receiving surface;
• wherein each of said panels has a side at substantially a right angle to said surface of said panel, and wherein each of said panels is abutting and joined along said side to said surface of said panel immediately adjacent to said side, and further wherein said beam passes through said beamsplitter panel and is split into a reflected beam and a translated beam, said translated beam proceeding substantially along said first path of said beam to said reflecting surface of said reflecting panel, and said reflected beam proceeding along a second path toward a test surface;
• a second retroreflector positioned in reflective relation with said second path of said reflected beam, to receive from said test surface said reflected beam, said reflected beam then being reflected from said second retroreflector back to said test surface and through said beamsplitter panel along a third path;
• and
• a detection system in reflective relation with said paths of said translated beam and said reflected beam, to receive said translated beam after it has reflected off of said reflecting surface of said reflecting panel and back off of said beamsplitter panel along a fourth path, and to receive said reflected beam after it comes from said test surface through said beamsplitter panel along said third path;
• wherein receipt of said third path of said reflected beam and said fourth path of said translated beam by said detection system creates an interference pattern viewable to a user of said interferometer assembly, without the need of aligning said test surface.

An interferometer assembly, comprising:

• a radiation source for emitting a beam along a first path;
• a beamsplitter in said first path of said beam to split said beam into a reflected beam and a translated beam, said translated beam proceeding substantially along said first path of said beam to a first retroreflector, and said reflected beam proceeding along a second path toward a test surface;
• a second retroreflector positioned in reflective relation with said second path of said reflected beam, to receive from said test surface said reflected beam, said reflected beam then being reflected from said second retroreflector back to said test surface and through said beamsplitter along a third path;
• and
• a detection system in reflective relation with said paths of said translated beam and said reflected beam, to receive said translated beam after it has reflected off of said first retroreflector and back off of said beamsplitter along a fourth path, and to receive said reflected beam after it comes from said test surface through said beamsplitter along said third path;
• wherein receipt of said third path of said reflected beam and said fourth path of said translated beam by said detection system creates an interference pattern viewable to a user of said interferometer assembly, without the need of aligning said test surface.

An interferometer assembly, comprising:

• a radiation source for emitting a beam along a first path;
• a beamsplitter in said first path of said beam to split said beam into a reflected beam and a translated beam, said translated beam proceeding substantially along said first path of said beam to a reference mirror, and said reflected beam proceeding along a second path toward a test surface;
• a retroreflector positioned in reflective relation with said second path of said reflected beam along an optical path of said reflected beam, said retroreflector being selectively moveable in relation to said optical path, to receive from said test surface said reflected beam, said reflected beam then being reflected from said retroreflector back to said test surface and through said beamsplitter along a third path;
• and
• a detection system in reflective relation with said paths of said translated beam and said reflected beam, to receive said translated beam after it has reflected off of said reference mirror and back off of said beamsplitter along a fourth path, and to receive said reflected beam after it comes from said test surface through said beamsplitter along said third path;
• wherein receipt of said third path of said reflected beam and said fourth path of said translated beam by said detection system creates an interference pattern viewable to a user of said interferometer assembly, without the need of aligning said test surface.

An interferometer assembly, comprising:

• a radiation source for emitting a beam along a first path;
• a first retroreflector assembly, comprising:
• a beamsplitter panel in said first path of said beam;
• a reflecting panel having a reflecting surface in reflecting relation with said beamsplitter panel;
• and
• a support panel having a receiving surface;
• wherein each of said panels has a side at substantially a right angle to said surface of said panel, and wherein each of said panels is abutting and joined along said side to said surface of said panel immediately adjacent to said side, and further wherein said beam passes through said beamsplitter panel and is split into a reflected beam and a translated beam, said translated beam proceeding substantially along said first path of said beam to said reflecting surface of said reflecting panel, and said reflected beam proceeding along a second path toward a test surface;
• a second retroreflector positioned in reflective relation with said second path of said reflected beam along an optical path of said reflected beam, said second retro-reflector being selectively moveable in relation to said optical path, to receive from said test surface said reflected beam, said reflected beam then being reflected from said second retroreflector back to said test surface and through said beamsplitter panel along a third path;
• and
• a detection system in reflective relation with said paths of said translated beam and said reflected beam, to receive said translated beam after it has reflected off of said reflecting surface of said reflecting panel and back off of said beamsplitter panel along a fourth path, and to receive said reflected beam after it comes from said test surface through said beamsplitter panel along said third path;
• wherein receipt of said third path of said reflected beam and said fourth path of said translated beam by said detection system creates an interference pattern viewable to a user of said interferometer assembly, without the need of aligning said test surface.

An interferometer assembly, comprising:

• a radiation source for emitting a beam along a first path;
• a beamsplitter in said first path of said beam to split said beam into a reflected beam and a translated beam, said translated beam proceeding substantially along said first path of said beam to a first retroreflector, and said reflected beam proceeding along a second path toward a test surface;
• a second retroreflector positioned in reflective relation with said second path of said reflected beam along an optical path of said reflected beam, said second retro-reflector being selectively moveable in relation to said optical path, to receive from said test surface said reflected beam, said reflected beam then being reflected from said second retroreflector back to said test surface and through said beamsplitter along a third path;
• and
• a detection system in reflective relation with said paths of said translated beam and said reflected beam, to receive said translated beam after it has reflected off of said first retroreflector and back off of said beamsplitter along a fourth path, and to receive said reflected beam after it comes from said test surface through said beamsplitter along said third path;
• wherein receipt of said third path of said reflected beam and said fourth path of said translated beam by said detection system creates an interference pattern viewable to a user of said interferometer assembly, without the need of aligning said test surface.

A method of profiling an object surface using an alignment-free interferometer, comprising the steps of:

• directing a beam from a radiation source along a first path towards a beamsplitter;
• dividing said beam at said beamsplitter into a translated beam passing through said beamsplitter along a path substantially equivalent to said first path of said beam and toward a reference mirror, and into a reflected beam traveling along a second path toward said object surface;
• reflecting said reflected beam off of said object surface to a retroreflector, and then along a third path substantially parallel to said second path back off of said object surface and through said beamsplitter;
• reflecting said translated beam off of said reference mirror along a fourth path toward said beamsplitter;
• and
• recombining said reflected beam traveling along said third path from said beamsplitter and said translated beam traveling along said fourth path also from said beamsplitter, to form an interference pattern representative of said surface profile of said object surface.

A method of profiling an object surface using an alignment-free interferometer, comprising the steps of:

• directing a beam from a radiation source along a first path towards a first retroreflector assembly, said first retroreflector assembly comprising a beamsplitter panel in said first path of said beam, a reflecting panel having a reflecting surface in reflecting relation with said beamsplitter panel, and a support panel having a receiving surface, wherein each of said panels has a side at substantially a right angle to said surface of said panel, and wherein each of said panels is abutting and joined along said side to said surface of said panel immediately adjacent to said side, and further wherein said directing step directs said beam through said beamsplitter panel of said first retroreflector;
• dividing said beam at said beamsplitter panel into a translated beam passing through said beamsplitter panel along a path substantially equivalent to said first path of said beam and toward said reflecting surface of said reflecting panel, and into a reflected beam traveling along a second path toward said object surface;
• reflecting said reflected beam off of said object surface to a second retroreflector, and then along a third path substantially parallel to said second path back off of said object surface and through said beamsplitter panel;
• reflecting said translated beam off of said reflecting surface of said reflecting panel along a fourth path toward said beamsplitter panel;
• and
• recombining said reflected beam traveling along said third path from said beamsplitter and said translated beam traveling along said fourth path also from said beamsplitter, to form an interference pattern representative of said surface profile of said object surface.

A method of profiling an object surface using an alignment-free interferometer, comprising the steps of:

• directing a beam from a radiation source along a first path towards a beamsplitter;
• dividing said beam at said beamsplitter into a translated beam passing through said beamsplitter along a path substantially equivalent to said first path of said beam and toward a first retroreflector, and into a reflected beam traveling along a second path toward said object surface;
• reflecting said reflected beam off of said object surface to a second retroreflector, and then along a third path substantially parallel to said second path back off of said object surface and through said beamsplitter;
• reflecting said translated beam off of said first retroreflector along a fourth path toward said beamsplitter;
• and
• recombining said reflected beam traveling along said third path from said beamsplitter and said translated beam traveling along said fourth path also from said beamsplitter, to form an interference pattern representative of said surface profile of said object surface.