MIP mapping based on material properties
AssigneeEvans & Sutherland Computer Corporation
InventorNeal L. Mayer
Life of this patent
Estimating the term…
Loading patent…
AssigneeEvans & Sutherland Computer Corporation
InventorNeal L. Mayer
Estimating the term…
A method for MIP mapping index texture. This invention has index texture with texel index values which refer to physical material properties. First, a lookup table is stored and the lookup table has table entries defining material types. Each table entry has an index, and material property type values. Then at least two texels are selected from the index texture, where each texel has index values corresponding to table entries. Next, the material property type values are averaged for each separate property type from the table entries for the selected texels. This produces an average material property value for each material property type. Another step is selecting a new material index based on the material which most closely matches the average material property values. The final step is generating the next lowest MIP level by using the new material indexes to form a new index texture with fewer texels.
A method for MIP mapping index texture, having texel index values, and using physical material properties, comprising the steps of:
A method for MIP mapping index texture having index values which refer to physical material proper ties, comprising the steps of:
An index texture having texel index values and MIP maps based on physical material properties, comprising:
Dependencies are inferred from the claim text.