Apparatus and method for producing an ion channel microprobe
AssigneeUniversity of Connecticut
InventorsJohn T. Bahns, William C. Stwalley
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AssigneeUniversity of Connecticut
InventorsJohn T. Bahns, William C. Stwalley
Estimating the term…
A noncontact method and apparatus for testing electrical circuitry which provides large improvements in both resolution and speed. The attributes of noncontact, high resolution, and speed are satisfied by using inexpensive low intensity resonant laser beams in a shroud gas preferably comprising rubidium atoms in argon gas to create an electrically conductive ion channel microprobe. The conductive ion channel microprobe can be used to create an electrically conductive path between a circuit's test pad or point and signal generation and detection apparatus. If the circuit's test pad or point is functioning properly, then the ion channel microprobe will complete the electrically conductive path, the signal generation device will produce a signal over the conductive path and the signal detection device will detect or measure the signal. If the circuit's test pad or point is malfunctioning, the conductive path will remain open and the signal detection device will not detect a signal.
A system for producing an ion channel, comprising:
A system for producing an ion channel, comprising:
A system for producing an ion channel, comprising:
A system for producing a conductive ion channel for testing an electrically conductive test point, comprising:
A method for producing a conductive ion channel between first and second electrically conductive materials, comprising the steps of:
A shroud gas which can be ionized which comprises an alkali metal selected from the group consisting of rubidium, potassium, lithium, sodium and cesium in combination with a gas selected from the group consisting of argon, helium, neon, krypton, xenon and nitrogen, said gas having a temperature of less than about 100° C. and a pressure greater than about 0.5 atm;
Dependencies are inferred from the claim text.