Quantified fluorescence microscopy
OwnerJean I. Montaguinventor
Life of this patent
Estimating the term…
Abstract
A calibration tool for fluorescent microscopy comprises a support on which is carried a solid surface layer comprised of effective fluorophores, and a thin mask of non-fluorescent material defining reference feature openings of limited dimensions exposes portions of the fluorophore-comprising surface layer.
Claims26
A calibration tool for fluorescent microscopy comprising a support on which is carried a solid surface layer comprised of effective fluorophores, and a thin mask of non-fluorescent material, wherein the fluorophore-comprising surface layer and the mask are deposited substantially in contact with each other defining reference feature openings of limited dimensions exposing portions of the fluorophore-comprising surface layer.
A process for producing the a calibration tool comprising:
- providing a support,
- creating in contact a solid surface layer, comprising effective fluorophores emitting surface fluorescence, and a thin mask of non-fluorescent material, wherein the mask is patterned to define reference feature openings of limited dimensions exposing portions of the fluorophore-comprising surface layer, the reference feature openings defining alignment features for fluorescent microscopy.
A method of quantified fluorescence microscopy comprising
- providing a fluorescence detecting microscope,
- providing a calibration tool including support arranged to carry a solid surface layer comprising effective fluorophores, and a thin mask of non-fluorescent material, wherein the fluorophore-comprising surface layer and the mask are deposited substantially in contact with each other defining reference feature openings of limited dimensions exposing portions of the fluorophore-comprising surface layer,
- detecting surface fluorescence emitted from the fluorophore-comprising surface layer,
- employing said calibration tool to calibrate the microscope, and
- performing fluorescence microscopy of specimens employing the calibrated microscope.
A calibration tool for fluorescent microscopy comprising a support, a solid surface layer including a fluorescent material, and a thin opaque mask of non-fluorescent material defining reference feature openings having selected dimensions exposing portions of the surface layer, wherein said thin opaque mask is fabricated onto the support being optically transparent, and wherein solid surface layer including the fluorescent material is deposited on the thin opaque mask.
Dependencies are inferred from the claim text.